Patrick Vandewalle

Patrick Vandewalle

Current Position

Senior Scientist, Philips Research Eindhoven, The Netherlands

Contact Information

contact information

Education

Ph.D. Ecole Polytechnique Fédérale de Lausanne, Switzerland
M. Sc. Katholieke Universiteit Leuven, Belgium


Research Interests

  • Super-resolution imaging
  • Sampling theory and aliasing
  • 3D imaging and 2D-to-3D conversion
  • Digital photography
  • Plenoptic sampling

Recent Talks

ICASSP 07 (special session), Honolulu, HI, Apr 18, 2007: Experiences with Reproducible Research in Various Facets of Signal Processing Research.

Public PhD defense, EPFL, Switzerland, Jul 21, 2006: Super-Resolution from Unregistered Aliased Images.

Private PhD defense, EPFL, Switzerland, Jun 27, 2006: Super-Resolution from Unregistered Aliased Images.

VCIP 06 (invited paper), San Jose, CA, Jan 17, 2006: Registration of Aliased Images for Super-Resolution Imaging.